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Solidus Technologies STI3000 Wafer Probe Test System |
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs. At the core of the test system is STI’s proprietary Drive Sense Technology (DST). DST combines unique circuitry, software and test methods to produce the most accurate representation of MEMS sensor dynamic behavior in shorter test times when compared to traditional MEMS probe test methods. |
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