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Accel-RF and Peritest will exhibit at EuMW 2009 in Rome Italy!!! |
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We will exhibit a full reliability system at European Microwaveweek in Rome Italy Sept 28th to October 1st. |
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Accel-RF ships first Millimeter Wave RF Reliability Test System 60 GHz! |
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The new Millimeter Wave RF Reliability Test System is designed to stress devices with up to +20 dBm of RF power at 60 GHz with a surface temperature of up to 250°C. See the attached brochure for more information, or contact the Peritest sales team. |
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Accel-RF will exhibit at CS Mantech May 18th - 21st!!! |
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Accel-RF exhibit a full reliability system at CS Mantech. Come and visit booth 315 |
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Growing Installed Base - MT2168 meets market expectations with a future oriented solution |
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Multitest has shipped the first MT2168 pick & place test handling system to USA. With this shipment the MT2168 covers now Asia, Europe and USA. The fast acceptance of this new system is based on the leading solution itself but additionally . . . |
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Peritest representing Solidus Technologies, Inc. |
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Since few monthes, Peritest is representing the company Solidus Technologies Inc, a visionary MEMS and Mixed Signal ASIC Test Equipment (ATE) product development company offering a diverse portfolio of MEMS and Mixed Signal ASIC Test Equipment, Manufacturing and Engineering services.
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Solidus Technologies STI9000 Mixed Signal Tester |
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The STI9000 is a mixed signal ATE used for testing ASIC and MEMS products. Each STI9000 test instrument fits into a small tester mainframe and contains multi-functional analog and digital test resources. All of the test functions are managed by an on-board microcontroller. In this manner, each STI9000 test instrument can run independently as it's own tester or multiple STI9000 instruments can be combined to operate as a highly parallel DUT test system. |
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Solidus Technologies STI3000 Wafer Probe Test System |
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs. At the core of the test system is STI’s proprietary Drive Sense Technology (DST). DST combines unique circuitry, software and test methods to produce the most accurate representation of MEMS sensor dynamic behavior in shorter test times when compared to traditional MEMS probe test methods. |
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Solidus Technologies STI3000E Test Head |
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with Drive Sense Technology
The STI3000E is a wafer probe test head module that contains a wide variety of fully configurable mixed-signal tester resources for characterizing MEMS gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
A product configurable 70-pin probe ring insert attaches to the test head module, and contains the device probe pins and configurable signal pins. |
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MULTITEST - Market Appreciates Load Board Compatibility - MT2168 offers valuable advantages by the re-use of existing load boards |
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The design of the MT2168 allows customer to use existing load boards. This advantage comprises not only cost for new load boards, but also facilitates to change between test equipment according to the current needs of the actual slot.
This unique features is well accepted by the market. Customers already use or plan to use load boards originally designed for . . . |
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Multitest MEMS Test Module for Hall - Multitest MEMS test concept for cost-efficient testing |
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Multitest recently received its first order for a MEMS module for a hall application by an international IDM for an automotive application. The decision was driven by efforts to bring down cost of test. The application will run on the MT99xx, Multitest’s kitable high speed gravity handler, which is octal site qualified. This allows to benefit from . . . |
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MULTITEST - MT2168 among the “Best-of-Test” Finalists - Test & Measurement World elects MT2168 in TOP 6 |
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Test & Measurement World’s editors have reviewed many products nominated by various vendors, that were introduced between November 1, 2007, and October 31, 2008. |
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Multitest will merge with the Semiconductor Test Group of ECT |
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Multitest elektronische Systeme GmbH, Rosenheim, Germany, announces today that it will merge with the Semiconductor Test Group of Everett Charles Technologies, Pomona, USA (ECT). |
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